Sub-2nm manufacturing is blurring traditional process boundaries as shrinking dimensions and tighter margins make test, metrology, inspection, and manufacturing increasingly interdependent.
Through better manufacturing screening, DFT for systems and fleet monitors, this major scourge on data center hardware is gradually being tamed.
Kilowatt-class AI accelerators are forcing engineers to rethink what counts as adequate coverage across workload, thermal behavior, test hardware, and time.
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